Focused Double Beam Microscope Ion&Electron Beam Analysis Instrument
Product Description
Product advantage
1. High pressure tunnel technology and electronic tube without magnetic leakage objective, high resolution imaging, compatible with magnetic samples.
2. "Shadow" ion tube, highly stable and high quality ion beam, for high quality nano-machining and TEM sample preparation.
3. Piezoelectric ceramic driven manipulator in the sample warehouse, integrated control mode, accurate operation.
4. Autonomous and controllable, strong expansibility, integrated design of ion source replacement time is fast, the ultimate after-sales service.
Technical introduction
"Shadow" ion tube
Technical characteristics
Resolution: 3 nm@30 kV
Probe current: 1 pA~65 nA
Acceleration voltage range: 500 V~30 kV
Service life: ≥1000 hours
Long-term stability: 72 hours of uninterrupted work
nanomanipulator
Technical characteristics
Installation mode in warehouse
All-piezoelectric drive
Coding accuracy ≤10nm
Maximum moving speed 2mm/s
Integrated control mode
Ion beam-electron beam synergy
Gas injector
Single gas injection
Various air sources are available
Telescopic distance ≥35 mm
Repeated positioning accuracy ≤10 um
Heating temperature control precision ≤0.1ºC
Heating temperature range: room temperature ~90ºC
Integrated control mode
Detailed Photos
Exhibition & Customers
Field Application
Packaging & Shipping
FAQ
Q1:How to choose a suitable machine?
A1:You can tell us the working piece material, size, and the request of machine function. We can recommend the most suitable machine according to our experience.
Q2:What is the warranty period for the equipment?
A2:One year warranty and 24 hours online professional technical support.
Q3:Why choose us?
A3:OEM/ODM/Designing service.
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