High-Performance Probing Machine for 300mm Wafer

Product Details
Customization: Available
After-sales Service: Online Service
Condition: New
Gold Member Since 2023

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  • High-Performance Probing Machine for 300mm Wafer
  • High-Performance Probing Machine for 300mm Wafer
  • High-Performance Probing Machine for 300mm Wafer
  • High-Performance Probing Machine for 300mm Wafer
  • High-Performance Probing Machine for 300mm Wafer
  • High-Performance Probing Machine for 300mm Wafer
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  • Overview
  • Product Description
  • Exhibition & Customers
  • Packaging & Shipping
  • FAQ
Overview

Basic Info.

Model NO.
AP3000
Speed
High Speed
Precision
Precision
Certification
ISO
Warranty
12 Months
Automatic Grade
Automatic
Type
High-speed Chip Mounter
Maintenance
Free Maintenance
Prober Network
Supports Various Protocols (Veganet, Light-Veganet
Precision Levcel
Ultra-High Performance Level.
Throughput
High Speed for Index Move, Wafer Handle
Vibration
Low Vibration Operation
Noise
Low Noise Operation
Recipe Compatibility
Maintains Compatibility with Existing Recipes
Map Data Compatibility
Maintains Compatibility with Existing Wafer Maps
Gp-Ib Interface
an Optional Hardware Interface
Transport Package
Wooden Box
Specification
Customized
Trademark
Himalaya
Origin
China
HS Code
9030820000
Production Capacity
300

Product Description

Product Description

The AP3000/AP3000e is a next-generation, ultra-high-performance probing machine engineered for superior precision and throughput. It emphasizes user-friendliness, safety, and security while maintaining backward compatibility with previous models.

High-Performance Probing Machine for 300mm Wafer
High-Performance Probing Machine for 300mm Wafer


Feature
AP3000/AP3000e is a next-generation ultra-high-performance probing machine designed to achieve high precision, high throughput (index move, wafer handling, and wafer alignment), low vibration and low noise.
Anti-Virus/Anti-Malware software is installed as standard software on the machine.
The functions and operability of AP3000/AP3000e are inherited from previous models, and it maintains compatibility of recipe and map data. It is very user friendly with safety and security in mind.


Option
Needle cleaning (cleaning wafer, or cleaning unit)
Fan filter unit (mini-environment)
HF jig/manipulator, Tester interface
Loader : 2 Loader / Automation with AMHS
Head stage tilt (Probe card tilt)
Chuck: Ambient / Hot temp. / Low temp. /Low noise
APC : Auto probe card exchange
Cassette ID reading
Wafer ID reading (Top surface / Back surface)
GB-IB Interface
Prober Network (Veganet, Light-Veganet, Vega-Planet, GEM)
PCAS (Probe card auto setup)
Probe card PGV
PLP testing for up to 300mm square

High-Performance Probing Machine for 300mm WaferHigh-Performance Probing Machine for 300mm WaferHigh-Performance Probing Machine for 300mm Wafer
Item Type Description  
Standard Features High Performance & Precision Standard Next-generation platform for ultra-high precision and throughput.
High Throughput Standard Optimized for fast index move, wafer handling, and alignment.
Low Vibration & Noise Standard Engineered for operational stability and a quieter environment.
Backward Compatibility Standard Inherits functions and operability from previous models.
Recipe & Map Compatibility Standard Maintains compatibility with existing recipe and map data.
User-Friendly Design Standard Focus on safety and ease of use for the operator.


 
Exhibition & Customers

 

High-Performance Probing Machine for 300mm Wafer
Packaging & Shipping

High-Performance Probing Machine for 300mm Wafer
 

FAQ

Q1:How to choose a suitable machine?

A1:You can tell us the working piece material, size, and the request of machine function. We can recommend the most suitable machine according to our experience. 

Q2:What is the warranty period for the equipment?
A2:One year warranty and 24 hours online professional technical support.

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